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  2. Check valve - Wikipedia

    en.wikipedia.org/wiki/Check_valve

    A swing check valve (or tilting disc check valve) is a check valve in which the disc, the movable part to block the flow, swings on a hinge or trunnion, either onto the seat to block reverse flow or off the seat to allow forward flow. The seat opening cross-section may be perpendicular to the centerline between the two ports or at an angle.

  3. Butterfly valve - Wikipedia

    en.wikipedia.org/wiki/Butterfly_valve

    A butterfly valve is from a family of valves called quarter-turn valves. In operation, the valve is fully open or closed when the disc is rotated a quarter turn. The "butterfly" is a metal disc mounted on a rod. When the valve is closed, the disc is turned so that it completely blocks off the passageway. When the valve is fully open, the disc ...

  4. Wafer (electronics) - Wikipedia

    en.wikipedia.org/wiki/Wafer_(electronics)

    Bottom right: completed solar wafers. In electronics, a wafer (also called a slice or substrate) [ 1] is a thin slice of semiconductor, such as a crystalline silicon (c-Si, silicium), used for the fabrication of integrated circuits and, in photovoltaics, to manufacture solar cells . The wafer serves as the substrate for microelectronic devices ...

  5. FOUP - Wikipedia

    en.wikipedia.org/wiki/FOUP

    FOUP. FOUP (an acronym for Front Opening Unified Pod[ 1] or Front Opening Universal Pod[ 2]) is a specialized plastic carrier designed to hold silicon wafers securely and safely in a controlled environment, and to allow the wafers to be transferred between machines for processing or measurement. [ 3]

  6. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing. Wafer testing is a step performed during semiconductor device fabrication after the back end of line (BEOL) process is finished. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test ...

  7. Wafer-level packaging - Wikipedia

    en.wikipedia.org/wiki/Wafer-level_packaging

    A wafer-level package attached to a printed-circuit board. Wafer-level packaging ( WLP) is a process in integrated circuit manufacturing where packaging components are attached to an integrated circuit (IC) before the wafer – on which the IC is fabricated – is diced. In WLP, the top and bottom layers of the packaging and the solder bumps ...

  8. Tube socket - Wikipedia

    en.wikipedia.org/wiki/Tube_socket

    An early transistor socket and an integrated circuit socket are included for comparison. Tube sockets are electrical sockets into which vacuum tubes (electronic valves) can be plugged, holding them in place and providing terminals, which can be soldered into the circuit, for each of the pins. Sockets are designed to allow tubes to be inserted ...

  9. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Use and manufacture. A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [ 2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE .

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