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  2. Tesla valve - Wikipedia

    en.wikipedia.org/wiki/Tesla_valve

    The filaments ricochet off the periodic structures, deflecting increasingly sharply before being rerouted around the 'islands' and mixing. A Tesla valve, called a valvular conduit by its inventor, is a fixed-geometry passive check valve. It allows a fluid to flow preferentially in one direction, without moving parts.

  3. Butterfly valve - Wikipedia

    en.wikipedia.org/wiki/Butterfly_valve

    A butterfly valve is from a family of valves called quarter-turn valves. In operation, the valve is fully open or closed when the disc is rotated a quarter turn. The "butterfly" is a metal disc mounted on a rod. When the valve is closed, the disc is turned so that it completely blocks off the passageway. When the valve is fully open, the disc ...

  4. Wafer (electronics) - Wikipedia

    en.wikipedia.org/wiki/Wafer_(electronics)

    Bottom right: completed solar wafers. In electronics, a wafer (also called a slice or substrate) [ 1] is a thin slice of semiconductor, such as a crystalline silicon (c-Si, silicium), used for the fabrication of integrated circuits and, in photovoltaics, to manufacture solar cells . The wafer serves as the substrate for microelectronic devices ...

  5. Check valve - Wikipedia

    en.wikipedia.org/wiki/Check_valve

    A swing check valve (or tilting disc check valve) is a check valve in which the disc, the movable part to block the flow, swings on a hinge or trunnion, either onto the seat to block reverse flow or off the seat to allow forward flow. The seat opening cross-section may be perpendicular to the centerline between the two ports or at an angle.

  6. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing. Wafer testing is a step performed during semiconductor device fabrication after the back end of line (BEOL) process is finished. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test ...

  7. Bow and warp of semiconductor wafers and substrates

    en.wikipedia.org/wiki/Bow_and_warp_of...

    Bow is the deviation of the center point of the median surface of a free, un-clamped wafer from the reference plane, where the reference plane is defined by three corners of an equilateral triangle [clarification needed]. This definition is based on now obsolete ASTM F534. [ 1] Warp is the difference between the maximum and the minimum ...

  8. Die preparation - Wikipedia

    en.wikipedia.org/wiki/Die_preparation

    Wafer mounting is a step that is performed during the die preparation of a wafer as part of the process of semiconductor fabrication. During this step, the wafer is mounted on a plastic tape that is attached to a ring. Wafer mounting is performed right before the wafer is cut into separate dies. The adhesive film upon which the wafer is mounted ...

  9. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.